The trade press rely heavily on content contributed by experts from the industry they serve. In return for contributing your expertise on a topic of interest to their readership, you benefit from the credibility conferred by the publication's reputation and wide distribution to a targeted readership.
Editors are fiercely protective of their credibility and writing for them requires a clear understanding of their content and stylistic requirements. The experts within your organization are likely scientists and engineers who are much more valuable doing science and engineering than writing. We understand both sides. We know what the editors want. We have the ability and take the time to understand your technology. We can turn a 30 minute phone interview and a slide deck into an published article that meets both the editor's needs and your objectives.
New Workflows Broaden Access to S/TEM Analysis and Increase Productivity
Abstract: The DualBeam, which combines focused ion beam and scanning electron microscope (FIB-SEM), is regularly used for sample preparation in transmission electron microscopy (TEM). A DualBeam enables the user to thin specific regions of a bulk material to electron transparency. While this process is often performed manually, we describe an interactive guided TEM sample preparation process. By this method, the preparation process time is shortened for expert users, compared to manual processes, and enables novice users to obtain high-quality results routinely. The method can be used on almost any material to prepare thin lamellas for most common TEM applications.
Multiscale correlative tomography provides critical materials characterization of biomedical implants
Correlative multiscale tomography (CMT) is a new workflow that combines advanced imaging and analytical techniques to provide critical feedback to engineers designing new products, materials, and manufacturing processes.